Complete research data for: Wafer-scale correlated morphology and optoelectronic properties in GaAs/AlGaAs core-shell nanowires

This entry contains the full dataset associated with the paper: "Wafer-scale correlated morphology and optoelectronic properties in GaAs/AlGaAs core-shell nanowires", along with example code to explore the dataset. MATLAB is required to use this data.

To get started, open the "generate_plots.m" script, which takes the user through the data structure and figure plotting. The dataset includes:

• raw_data.mat - 108,329 TCSPC decay curves, measured across a 2-inch wafer of nanowires. The x axis (time) and positions (path) for each decay is also included.
• TCSPC_example.mat - an example (median) TCSPC decay used for the plot in the paper
• reflectivity data.mat - a processed map of reflectivity values and positions.
• nanowire/reference_pdep_PL.mat - photoluminescence spectra of the nanowire or GaAs reference wafer, recorded at different excitation powers. The spectra, powers and x axis (wavelength) are provided.
• nanowire/reference_pdep_TCSPC.mat - TCSPC decays of the nanowire or GaAs reference wafer, recorded at different excitation powers. The decays, powers and x axis (time) are provided.
• PL_SEM_correlation.mat - spatially-registered wafer-scale maps for TCSPC and SEM measurements, including PL intensity, fast lifetime, long lifetime, nanowire density, vertical yield, absorption and reflection.
• map_data.mat - processed TCSPC map data at both wafer- and micron-scales