Photoluminescence (PL) map fitting data (Lasher-Stern Werfel (LSW) fitting parameters, coordinates of individual heterostructures within PL map, raw PL spectra and corresponding LSW fitted curves)
Data from analysed Scanning Electron Microscopy (SEM) images (diameters, coordinates of individual structures, solidity and eccentricity of detected heterostructures)
This dataset underpins the measurement of intrawire and interwire disorder for GaAs/GaAsP nanowire segments. It shows that highly homogeneous emission can be achieved through strain management in quantum well systems.