SEM & EDX (Zeiss Sigma) of MXene nanoparticles
Reduced accelerating voltage (≤ 10 kV) EDX is used in combination with secondary electron imaging in an attempt to reduce sub-surface/substrate X-ray emission and confirm nanoparticle presence.
See uploaded .pdf for full experimental details.
Funding
EPSRC Centre for Doctoral Training in the Science and Technology of Fusion Energy
Engineering and Physical Sciences Research Council
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