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SEM & EDX (Zeiss Sigma) of MXene nanoparticles

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posted on 2023-03-13, 17:07 authored by James BirdJames Bird

Reduced accelerating voltage (≤ 10 kV) EDX is used in combination with secondary electron imaging in an attempt to reduce sub-surface/substrate X-ray emission and confirm nanoparticle presence.


See uploaded .pdf for full experimental details.

Funding

EPSRC Centre for Doctoral Training in the Science and Technology of Fusion Energy

Engineering and Physical Sciences Research Council

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