XRD analysis of freeze-cast, compressed, LFA'd MXene films - PANalytical X'Pert Pro
<p>Characterisation of the phase change of a Ti<sub>3</sub>C<sub>2</sub> MXene aerogel using Rietveld refinement of XRD patterns, as a result of conducting laser flash analysis up to 700 C.</p>
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<p>For full experimental details and a description of the data, see the attached .pdf.</p>
Funding
EPSRC Centre for Doctoral Training in the Science and Technology of Fusion Energy
Engineering and Physical Sciences Research Council
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