XRD analysis of freeze-cast, compressed, LFA'd MXene films - PANalytical X'Pert Pro
Characterisation of the phase change of a Ti3C2 MXene aerogel using Rietveld refinement of XRD patterns, as a result of conducting laser flash analysis up to 700 C.
For full experimental details and a description of the data, see the attached .pdf.
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