XRD analysis of vacuum-filtered MXene film - PANalytical X'Pert Pro
<p>An attempt is made to characterise the crystallographic texture of a vacuum-filtered Ti<sub>3</sub>C<sub>2</sub> MXene film and verify composition/purity using Rietveld refinement.</p>
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<p>For full experimental details and description of uploaded data, see the uploaded .pdf.</p>
Funding
EPSRC Centre for Doctoral Training in the Science and Technology of Fusion Energy
Engineering and Physical Sciences Research Council
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