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XRD analysis of vacuum-filtered MXene film - PANalytical X'Pert Pro
An attempt is made to characterise the crystallographic texture of a vacuum-filtered Ti3C2 MXene film and verify composition/purity using Rietveld refinement.
For full experimental details and description of uploaded data, see the uploaded .pdf.
Funding
EPSRC Centre for Doctoral Training in the Science and Technology of Fusion Energy
Engineering and Physical Sciences Research Council
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