XRD analysis of vacuum-filtered MXene film - PANalytical X'Pert Pro
An attempt is made to characterise the crystallographic texture of a vacuum-filtered Ti3C2 MXene film and verify composition/purity using Rietveld refinement.
For full experimental details and description of uploaded data, see the uploaded .pdf.
EPSRC Centre for Doctoral Training in the Science and Technology of Fusion Energy
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