<p>Secondary electron micrographs (SEM) aquired on Zeiss Ultra 55 of dropcast Ti<sub>3</sub>C<sub>2</sub>T<sub>x </sub>MXenes from which particle-size distribution analysis can be carried out. See .pdf containing description of complete protocol and results.</p>
Funding
EPSRC Centre for Doctoral Training in the Science and Technology of Fusion Energy
Engineering and Physical Sciences Research Council